Neues Fertigungsverfahren – bewährte Messmethoden?
White Paper
White Paper
Field Reliability Starts at the Wafer Level
Qualitätssicherung
in der additiven Fertigung
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Rethinking Wafer-Level Testing for Real-World Reliability
Download our whitepaper and discover practical ways to adapt your test strategy for real-use reliability.
The Shift from “Does It Work?” to “Will It Still Work?”
Even if your devices pass lab-based wafer testing, they can still encounter issues later during system-level testing or in the field. Even if your devices pass lab-based wafer testing, they can still encounter issues during system-level testing or in the field.
This whitepaper outlines how wafer testing strategies can evolve to reflect real-use conditions while maintaining efficiency. The wafer handling system is an essential part of overcoming the new challenges:
- Improve test relevance by simulating key environmental and electrical stress during wafer-level testing
- Enhance wafer handling systems to manage advanced testing scenarios and delicate substrates
- Integrate smart system communication to enable synchronized operation between probe cards, instrumentation, and test software
Who should read this?
- Wafer test engineers
- Product and quality teams
- Fab teams and testing service providers
- For everyone who is interested in the topic
Ready to Rethink Your Wafer Test Strategy?
Download the whitepaper!
Here you can download the white paper for free
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ACCRETECH (Europe) GmbH, headquartered in Munich and with locations in Italy, France, the UK, Hungry and Turkey works with sales and service partners throughout Europe. This means you always have a contact partner locally who can help you to implement integrated solutions for battery testing, quality assurance in production processes and for semiconductor production.
