Fully Automated 200 mm Frame Handling Prober

FP2000

The FP2000 is a fully automated 200 mm frame handling prober with an integrated frame-gripper function. This system offers a wide range of applications, including testing entire wafers as well as wafers on dicing frames.

Thanks to its modular design, the FP2000 wafer prober can be easily expanded and adapts flexibly to different requirements in semiconductor testing.

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Features and Specifications

Fully automated operation
Supports wafers on dicing frames: 2-8-1, 2-6-1
Compatible with standard wafers in sizes: 5″, 6″, and 8″
Newly developed software for chip position correction
Automatic wafer alignment
Automatic probe needle adjustment for contact point positioning

Optional Expansions

Multiple die probing
Needle cleaning
GP-IB interface
Probe mark inspection
Printer
Barcode reader
Wafer ID reader
Color camera
Flat loader

Want to learn more about technical details, supported wafer sizes, and expansion modules?

Request more information about FP2000

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