Fully Automated Wafer Prober for Maximum Precision and Throughput

UF2000

The UF2000 is a fully automated wafer prober for 120 to 200 mm wafers, delivering exceptional precision and flexibility. With micron-level placement control and accurate temperature regulation, the UF2000 enables highly efficient multi-pin probing with consistently high quality.

Thanks to its ±1.5 µm precision and state-of-the-art optics for placement accuracy, the UF2000 ensures reliable measurement results for every application. The ultra-stable Z/θ platform provides the ideal foundation for multi-pin probing contact. The environment temperature is precisely controllable, with the option for Low- or Hot-Temperature Chucks.

User comfort is enhanced with easy operation via a multifunctional touchscreen and the ability to control each drive axis independently. Furthermore, the UF2000 is highly customizable, with options such as a dual-lifter for increased productivity.

Experience the future of wafer probing technology – contact us for your tailored UF2000 solution!

Explore Our Full Product Line

Download the product overview to see how our solutions can support your needs.

Detailed insights into Probing technology

Read our whitepaper about rethinking semiconductor test environments to match real-world applications.

P_UF2000_sRGB

    Contact